Boekhandel Douwes Den Haag

Semiconductor Laser Engineering, Reliability and Diagnostics

A Practical Approach to High Power and Single Mode Devices

Peter W. Epperlein

Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics

A Practical Approach to High Power and Single Mode Devices

Semiconductor Laser Engineering, Reliability and Diagnostics

 

Provides a novel approach of high power, single transverse mode diode laser development by addressing the three complementary areas of device engineering, reliability engineering and device diagnostics in the same book and thus closes the gap in the current book literature.


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Beschrijving Semiconductor Laser Engineering, Reliability and Diagnostics

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.


ISBN
9781119990338
Pagina's
522
Verschenen
NUR
950
Druk
1
Uitvoering
Hardback
Taal
Engels
Uitgever
John Wiley and Sons Ltd

Technische wetenschappen